发明名称 |
Inspecting device for semiconductor wafer |
摘要 |
A inspecting device for a semiconductor wafer comprises: a holding unit which holds a wafer; an aligner unit which detects a cutout position and a center position of the wafer held by the holding unit and obtains position determining data of the wafer; an observing unit for magnifying and observing fine patterns on the wafer, the observing unit being disposed at a position where the wafer held by the holding unit can be observed; a moving unit which relatively moves the holding unit with respect to the observing unit; and a control unit which controls the moving unit to move the holding unit based on the obtained position data so that the fine patterns at a desired position can be observed.
|
申请公布号 |
US6963394(B2) |
申请公布日期 |
2005.11.08 |
申请号 |
US20030721381 |
申请日期 |
2003.11.26 |
申请人 |
NIDEK CO., LTD. |
发明人 |
YAMAMOTO TAKAYASU;ODA TATEFUMI |
分类号 |
H01L21/66;G01N21/95;H01L21/68;(IPC1-7):G01N21/00 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|