Semiconductor memory device implemented parallel bit test capable of test time and parallel bit test method using the same,申请号KR19990022308-传众专利搜索

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发明名称	Semiconductor memory device implemented parallel bit test capable of test time and parallel bit test method using the same
摘要
申请公布号	KR100524925(B1)	申请公布日期	2005.10.31
申请号	KR19990022308	申请日期	1999.06.15
申请人		发明人
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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