发明名称 Resist material and pattern formation method using the same
摘要 After forming a resist film including titanium oxide on a substrate, pattern exposure is performed by selectively irradiating the resist film with light of a wavelength of 400 nm or less or an electron beam. After the pattern exposure, the resist film is developed, so as to form a resist pattern made of the resist film.
申请公布号 US2005233259(A1) 申请公布日期 2005.10.20
申请号 US20050071163 申请日期 2005.03.04
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ENDO MASAYUKI;SASAGO MASARU
分类号 G03F7/004;G03F7/00;G03F7/039;G03F7/20;G03F7/26;H01L21/027;(IPC1-7):G03F7/00 主分类号 G03F7/004
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