发明名称 |
Position-sensitive germanium detectors having a microstructure on both contact surfaces |
摘要 |
The invention relates to a position-sensitive detector for measuring charged particles comprising a surface region, which is formed by an amorphous layer with a structured metallic layer disposed above it, characterised in that the structure of the metallic layer is continued into the amorphous layer.
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申请公布号 |
US2005230627(A1) |
申请公布日期 |
2005.10.20 |
申请号 |
US20040511734 |
申请日期 |
2004.10.18 |
申请人 |
FORSCHUNGSZENTRUM JULICH GMBH |
发明人 |
PROTIC DAVOR;KRINGS THOMAS |
分类号 |
G01T1/24;G01T1/161;G01T1/29;H01L31/0224;H01L31/115;H01L31/118;(IPC1-7):H01L31/115 |
主分类号 |
G01T1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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