| 发明名称 |
INSPECTION DEVICE, TEST JIG, AND TEST METHOD |
| 摘要 |
<P>PROBLEM TO BE SOLVED: To improve an inspection precision and inspection efficiency in the case of inspecting the electrical property of the sensor of electrostatic capacitance type. <P>SOLUTION: The inspection device for inspecting the electric property of the sensor 101 by making a conductor contact on the surface of the sensor 101 comprises the liquid film forming part 31 for spraying volatile liquid on the surface of the sensor 101 for forming liquid film as the conductor. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
| 申请公布号 |
JP2005292090(A) |
申请公布日期 |
2005.10.20 |
| 申请号 |
JP20040111428 |
申请日期 |
2004.04.05 |
| 申请人 |
SONY CORP |
发明人 |
KOBAYASHI SEIJI |
| 分类号 |
G01B7/28;A61B5/117;G01R27/26;G01R31/26 |
主分类号 |
G01B7/28 |
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