| 摘要 |
An integrated circuit having at least one microstrip line and at least one port, and a method of manufacturing the circuit are used, in particular, for test passes for development purposes during chip production and also during chip manufacture. At least some of the ports and/or microstrip lines in the integrated circuit have a removable, reflection-free termination which is integrated on the chip. The integrated circuit is produced in a first step, with at least some of the ports and/or microstrip lines in the integrated circuit being provided with a removable, reflection-free termination which is integrated on the chip, and in a second step for this termination to be removed from a prescribable selection of the ports and/or microstrip lines.
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