发明名称 Multideposition SACVD reactor
摘要 There is disclosed a high throughput multideposition SACVD reactor that enables the rapid thermal deposition of dielectric materials such as Si<SUB>3</SUB>N<SUB>4</SUB>, SiO<SUB>2</SUB>, and SiON and non-&electric materials such as polysilicon onto a semiconductor substrate in the same chamber according to the desired sequence. Such a reactor has a processing chamber which is well adapted to single semiconductor wafer processing. The processing chamber includes an improved susceptor to support the wafer and a specific gas distribution system adapted to supply the different gases used in the deposition process and for cleaning. The improved susceptor consists of a standard carbon plate coated with a polysilicon film to protect it against said cleaning gases when they are aggressive to carbon. The present invention also encompasses a method of fabricating said improved susceptor.
申请公布号 US2005229853(A1) 申请公布日期 2005.10.20
申请号 US20030704272 申请日期 2003.11.07
申请人 RAFFIN PATRICK;DELARUE FABRICE;WAECHTER JEAN M;BALSAN CHRISTOPHE;JOURNE JOEL 发明人 RAFFIN PATRICK;DELARUE FABRICE;WAECHTER JEAN M.;BALSAN CHRISTOPHE;JOURNE JOEL
分类号 H01L21/302;C23C16/44;C23C16/455;C23C16/458;C23C16/54;H01L21/205;H01L21/285;H01L21/3065;H01L21/31;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):C23C16/00 主分类号 H01L21/302
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