发明名称 Measurement circuit and method for serially merging single-ended signals to analyze them
摘要 Provided are a measurement circuit and method for serially merging single-ended signals to analyze them. To analyze two differential signals probed from a DUT, that is, DP and DM signals, the measurement circuit detects DP data from which its DC portion has been removed and DM data from which its DC portion has been removed, stores the two data signals in a memory, and then serially merges the two data signals stored in the memory without distorting them. The measurement circuit divides the serially merged signal at a predetermined period and overlaps the divided signals to generate eye diagram data and analysis data including crossover voltages, rising time, falling time and so on.
申请公布号 US2005235189(A1) 申请公布日期 2005.10.20
申请号 US20050075790 申请日期 2005.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SI-YOUNG
分类号 G01R31/319;G01R31/00;G01R31/28;G06F11/00;G06F11/30;G08C25/00;H03M13/00;H04B1/66;H04L1/00;H04L1/20;H04N7/12;H04N11/02;H04N11/04;(IPC1-7):H04B1/66 主分类号 G01R31/319
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