发明名称 INSPECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To realize an inspection circuit capable of inspecting an inspected object while preventing the influence of a voltage drop in a power source voltage caused by an impedance generated by the connection of a circuit. SOLUTION: When outputting a positive power source voltage VDD and a negative power source voltage VSS, a power source circuit E supplies the power source voltage more voltage-dropped than a differential voltage between the voltages VDD and VSS, to a driver D, by internal resistances of ammeters K1, K2 and a wire resistance of an electric power source line. A timing generation circuit T generates a pulse-like signal. A level shift circuit 2 switches a drive signal between prescribed voltages VDD-S and VSS-S, based on the signal. Since absolute values of the voltages VDD-S and VSS-S are lower than those of the voltage-dropped power source voltages VDD, VSS, a malfunction generated in a device when a signal level of the drive signal exceeds the power source voltage is prevented from occurring. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005291972(A) 申请公布日期 2005.10.20
申请号 JP20040108386 申请日期 2004.03.31
申请人 CASIO COMPUT CO LTD 发明人 TAKAHASHI HIROSHI
分类号 G01R31/316;G02F1/13;G02F1/133;G09G3/20;G09G3/36;(IPC1-7):G01R31/316 主分类号 G01R31/316
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