发明名称 CELL THICKNESS MEASURING METHOD AND MEASURING DEVICE FOR VERTICALLY ORIENTED LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To provide a cell thickness measurement method for vertically oriented liquid crystal panel and a cell thickness measuring device used therefor by using, as an equation representing a retardation caused in case that light is obliquely incident on a vertically oriented liquid crystal panel, an equation determined by strict calculation considering the refraction angles of ordinary light and abnormal light passed through a liquid crystal display panel. SOLUTION: This method comprises making a light of wavelengthλincident on the vertically oriented liquid crystal panel with liquid crystal sealed therein from a direction inclined by an angleθto the normal of the vertically oriented liquid crystal panel to measure the retardation R, and determining the cell thickness of the vertically oriented liquid crystal panel based on the retardation R, the incident angleθof the light, and an abnormal light refractive index n<SB>e</SB>and an ordinary light refractive index n<SB>0</SB>specific to the liquid crystal. The cell thickness of the vertically oriented liquid crystal panel is determined according to the equation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005283534(A) 申请公布日期 2005.10.13
申请号 JP20040102033 申请日期 2004.03.31
申请人 SEIKO EPSON CORP 发明人 HIGA MASAKATSU
分类号 G01B11/06;G02F1/13;(IPC1-7):G01B11/06 主分类号 G01B11/06
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