发明名称 |
A METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE HAVING A SILICIDED GATE ELECTRODE AND A METHOD FOR MANUFACTURING AN INTEGRATED CIRCUIT INCLUDING THE SAME |
摘要 |
<p>The present invention provides a method for manufacturing a semiconductor device and a method for manufacturing an integrated circuit including the semiconductor device. The method for manufacturing the semiconductor device (100), among other possible steps, includes forming a polysilicon gate electrode over a substrate (110) and forming source/drain regions (170) in the substrate (110) proximate the polysilicon gate electrode. The method further includes forming a blocking layer (180) over the source/drain regions (170), the blocking layer (180) comprising. a metal silicide, and siliciding the polysilicon gate electrode to form a silicided gate electrode (150).</p> |
申请公布号 |
WO2005096366(A1) |
申请公布日期 |
2005.10.13 |
申请号 |
WO2005US10288 |
申请日期 |
2005.03.28 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;LU, JIONG-PING;BU, HAOWEN;YU, SHAOFENG;JIANG, PING |
发明人 |
LU, JIONG-PING;BU, HAOWEN;YU, SHAOFENG;JIANG, PING |
分类号 |
H01L21/28;H01L21/336;H01L21/44;H01L29/49;H01L29/78;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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