发明名称 Method for manufacturing semiconductor device
摘要 In a production of a semiconductor device, after a step in which a thermosetting resin is thermally cured to seal a semiconductor chip with the resin and before a step in which a characteristic of the semiconductor chip is inspected, the thermosetting resin is baked at a temperature higher than the resin sealing temperature in said resin sealing step.
申请公布号 US2005227384(A1) 申请公布日期 2005.10.13
申请号 US20040519175 申请日期 2004.12.20
申请人 发明人 NAGANO KOUTA;MIURA HIDEO;YAGUCHI AKIHIRO
分类号 H01L21/56;H01L23/31;(IPC1-7):G01R31/26 主分类号 H01L21/56
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