SCANNING MICROSCOPE AND METHOD FOR EXAMINING A SAMPLE BY USING SCANNING MICROSCOPY

摘要

The invention relates to a scanning microscope (1) comprising: a light source (5) for producing an illuminating light beam (7); at least one objective (19) that focuses the illuminating light beam onto and/or into a sample (21); a beam deflecting device (11) that directs the focus of the illuminating light beam over and/or through the sample, and; a detection device (29) that receives detection light emanating from the sample. The scanning microscope is characterized in that a means for generating a manipulation illumination pattern (37) is provided and that projecting means project the manipulation illumination pattern onto and/or into the sample.