| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method for a ceramic structure, capable of not only knowing a position and a size of an internal defect of the ceramic structure but also grasping an accurate position, shape and size of the internal defect, nondestructively and easily in a short time. SOLUTION: When scanning the whole circumference of the ceramic structure with transmitted X-rays to measure a distribution of an X-ray absorption coefficient ( CT value) of a tomographic plane while irradiating X-rays along the whole periphery of the ceramic structure, a tube voltage of an X-ray tube irradiating the X-rays is 400-80 kV, and a tube current of the X-ray tube is 2-400 mA. COPYRIGHT: (C)2006,JPO&NCIPI |
