发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To increase the current and breakdown voltage of a semiconductor device while suppressing the increase of the on-resistance even when a semiconductor layer, in which an offset drain is formed, is formed on an insulator. <P>SOLUTION: The offset drain having a multi-RESURF structure is constituted in an elevated structure by respectively laminating an elevated offset drain layer 7a and a p-type elevated offset drain layer 7b upon an n-type offset drain layer 6a, and a p-type offset drain layer 6b formed on an SOI substrate. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2005276912(A) 申请公布日期 2005.10.06
申请号 JP20040084646 申请日期 2004.03.23
申请人 SEIKO EPSON CORP 发明人 HARA HISAKI
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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