发明名称 CIRCUIT SIMULATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a circuit simulation method with consideration to change of ambient temperature in transient analysis. SOLUTION: The circuit simulation method has a first process S2 of setting a relationship between the analysis time and ambient temperature, second processes S4 and S5 of changing an ambient temperature at the analysis time in accordance with the relationship between the analysis time and the ambient temperature, a third process S6 of calculating voltage values and current values of all nodes in a circuit to be analyzed in accordance with the changed ambient temperature, a fourth process S8 of setting the analysis time forward, and a fifth process S7 of repeating the third process S6 and the fourth process S8 until the analysis finish time, and it carries out the transient analysis of the circuit to be analyzed with respect to time variation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005275633(A) 申请公布日期 2005.10.06
申请号 JP20040085836 申请日期 2004.03.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOIZUMI MAKOTO;MISHIMA HIDEKI
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
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