发明名称 Assessment and optimization for metrology instrument
摘要 Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (URMS) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation.
申请公布号 US2005222804(A1) 申请公布日期 2005.10.06
申请号 US20050524286 申请日期 2005.02.10
申请人 ARCHIE CHARLES N;BANKE JR G W 发明人 ARCHIE CHARLES N.;BANKE JR G. W.
分类号 G03F7/20;G06F15/00;G06F19/00;(IPC1-7):G06F15/00 主分类号 G03F7/20
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