发明名称 SERIAL SWITCH DRIVER ARCHITECTURE FOR AUTOMATIC TEST EQUIPMENT
摘要 A TRISTATE CIRCUIT FOR DRIVING THREE SIGNAL LEVELS TO A PIN OF A DEVICE-UNDER-TEST IS DISCLOSED. THE TRISTATE CIRCUIT INCLUDES A DRIVER HAVING AN OUTPUT AT A FIRST SIGNAL LEVEL AND ADPATED FOR COUPLING TO THE PIN. A FIRST SWITCHING UNIT COUPLES TO THE OUTPUT AND RESPONDS TO A PROGRAMMED SIGNAL. THE FIRST SWITCHING UNIT OPERATES TO SELECTIVELY ALTER THE FIRST SIGNAL LEVEL TO A SECOND SIGNAL LEVEL. A SECOND SWITCHING UNIT CONNECTS SERIALLY TO THE FIRST SWITCH. THE SECOND SWITCHING UNIT RESPONDS TO A SECOND PROGRAMMED SIGNAL AND OPERATES TO COOPERATE WITH THE FIRST SWITCH TO ALTER THE SECOND SIGNAL LEVEL TO A THIRD SIGNAL LEVEL.
申请公布号 MY120264(A) 申请公布日期 2005.09.30
申请号 MY2000PI00565 申请日期 2000.02.17
申请人 TERADYNE, INC. 发明人 PETER BREGER
分类号 H03K19/00;G01R31/319 主分类号 H03K19/00
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