发明名称 SCHOTTKY BARRIER DIODE
摘要 PROBLEM TO BE SOLVED: To properly correct the shape, arrangement and the number of bumps for flip chip while reducing VF in a Schottky barrier diode having two poles formed on the same surface and arranged such that flip chip bonding can be carried out through bumps provided on that surface. SOLUTION: VF is reduced by snaking the isolation region between an anode (A) and a cathode (K) and lengthening the opposing length W of A-K thereby increasing the cross-section of a lateral current passage. Two bumps are formed on the outside of the snaking amplitude range B of electrode metal films 5 and 6 (or a single elongated bump is formed). Priority is given to reduction in chip size by setting the number of repetition of snaking to 1. VF is reduced furthermore by making A aperture 31 larger than K aperture 31 thereby increasing the Schottky junction area, and forming a metal 8 on the rear surface of a substrate 1. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005268296(A) 申请公布日期 2005.09.29
申请号 JP20040074579 申请日期 2004.03.16
申请人 NIPPON INTER ELECTRONICS CORP 发明人 TANAKA YASUHIRO;TOYOSHIMA TAKU;KAWASAKI SHIGERU;AKAIWA NORISHIGE
分类号 H01L29/872;H01L29/47;(IPC1-7):H01L29/47 主分类号 H01L29/872
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