发明名称 CHEMICAL MECHANICAL POLISHING EQUIPMENT
摘要 <P>PROBLEM TO BE SOLVED: To realize concrete constitution of a transparent platen which is employed in actual CMP equipment. <P>SOLUTION: In the chemical mechanical polishing equipment, a polishing pad 5 is bonded on a surface, when used, and a rotating platen and a wafer-holding mechanism 8 which rotates, while holding, so that it presses a wafer 7 against the polishing pad are included, wherein the platen has a rib structure and includes an opaque base 12 fitted to a rotating shaft, and a transparent plate 11 which is mounted on the base and includes the transparent plate 11 having a circular flat surface. The surface of the transparent plate 11 can be observed from a lower side of the base 12. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005259980(A) 申请公布日期 2005.09.22
申请号 JP20040069461 申请日期 2004.03.11
申请人 TOKYO SEIMITSU CO LTD 发明人 NUMAMOTO MINORU
分类号 B24B37/013;B24B37/12;H01L21/304 主分类号 B24B37/013
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