发明名称 |
Semiconductor component having an integrated capactiance structure and method for producing the same |
摘要 |
A semiconductor component has an insulating layer which is formed on a semiconductor substrate and in which a capacitance structure (K) is formed. The capacitance structure (K) has at least two metallization planes ( 1 to 7 ) which are arranged parallel to one another and are each connected to an electrical connecting line. Arranged between the metallization planes ( 1 to 7 ) is at least one electrically conductive region ( 1 a to 1 j ; 2 a to 2 j ; 31 a to 36 a ; 41 a to 46 a ; 5 a to 5 f) for producing a capacitance surface, the electrically conductive region ( 1 a to 1 j; 2 a to 2 j ; 31 a to 36 a ; 41 a to 46 a ; 5 a to 5 f) being electrically connected only to one of the metallization planes ( 1 to 7 ).
|
申请公布号 |
US2005208728(A1) |
申请公布日期 |
2005.09.22 |
申请号 |
US20050512017 |
申请日期 |
2005.04.29 |
申请人 |
BENETIK THOMAS;RUDERER ERWIN |
发明人 |
BENETIK THOMAS;RUDERER ERWIN |
分类号 |
H01L27/04;H01L21/822;H01L23/522;(IPC1-7):H01L21/20 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|