发明名称 Semiconductor component having an integrated capactiance structure and method for producing the same
摘要 A semiconductor component has an insulating layer which is formed on a semiconductor substrate and in which a capacitance structure (K) is formed. The capacitance structure (K) has at least two metallization planes ( 1 to 7 ) which are arranged parallel to one another and are each connected to an electrical connecting line. Arranged between the metallization planes ( 1 to 7 ) is at least one electrically conductive region ( 1 a to 1 j ; 2 a to 2 j ; 31 a to 36 a ; 41 a to 46 a ; 5 a to 5 f) for producing a capacitance surface, the electrically conductive region ( 1 a to 1 j; 2 a to 2 j ; 31 a to 36 a ; 41 a to 46 a ; 5 a to 5 f) being electrically connected only to one of the metallization planes ( 1 to 7 ).
申请公布号 US2005208728(A1) 申请公布日期 2005.09.22
申请号 US20050512017 申请日期 2005.04.29
申请人 BENETIK THOMAS;RUDERER ERWIN 发明人 BENETIK THOMAS;RUDERER ERWIN
分类号 H01L27/04;H01L21/822;H01L23/522;(IPC1-7):H01L21/20 主分类号 H01L27/04
代理机构 代理人
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