发明名称 Method for dishing reduction and feature passivation in polishing processes
摘要 Methods and apparatus for planarizing a substrate surface are provided. In one aspect, a method is provided for planarizing a substrate surface including polishing a first conductive material to a barrier layer material, depositing a second conductive material on the first conductive material by an electrochemical deposition technique, and polishing the second conductive material and the barrier layer material to a dielectric layer. In another aspect, a processing system is provided for forming a planarized layer on a substrate, the processing system including a computer based controller configured to cause the system to polish a first conductive material to a barrier layer material, deposit a second conductive material on the first conductive material by an electrochemical deposition technique, and polish the second conductive material and the barrier layer material to a dielectric layer.
申请公布号 US2005202677(A1) 申请公布日期 2005.09.15
申请号 US20050114936 申请日期 2005.04.25
申请人 HSU WEI-YUNG;CHEN LIANG-YUH;MORAD RATSON;CARL DANIEL A. 发明人 HSU WEI-YUNG;CHEN LIANG-YUH;MORAD RATSON;CARL DANIEL A.
分类号 H01L21/288;H01L21/321;(IPC1-7):C25C3/00 主分类号 H01L21/288
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