发明名称 SURFACE STRUCTURE FOR VACUUM PROCESSING CHAMBER
摘要 PROBLEM TO BE SOLVED: To provide a surface structure capable of preventing residual impurity in vacuum, in particular, remaining water molecules from being produced, while keeping acid resistance and heat resistance, in a vacuum processing chamber, such as an ALD apparatus or a CVD apparatus. SOLUTION: A hydrophobic organic high polymer film, comprising a polyimide resin film containing a fluorine atom is formed on the surface of a member 1 exposed to vacuum in a vacuum processing chamber by deposition polymerization reaction. In deposition polymerization of the polyimide resin film, a monomer, having a hydrophobic group containing a fluorine atom able to exist in isolation from a polymerization reaction, is preferably used as at least one kind of a stock monomer. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005251975(A) 申请公布日期 2005.09.15
申请号 JP20040060270 申请日期 2004.03.04
申请人 ULVAC JAPAN LTD 发明人 TAKAHASHI YOSHIKAZU;INAYOSHI SAKAE;NAKAMURA KYUZO
分类号 C23C16/44;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/44
代理机构 代理人
主权项
地址