发明名称 |
Semiconductor component and method of manufacture |
摘要 |
A semiconductor component having a metallization system that includes a multi-metal seed layer and a method for manufacturing the semiconductor component. A layer of dielectric material is formed over a lower level interconnect. A hardmask is formed over the dielectric layer and an opening is etched through the hardmask into the dielectric layer. The opening is lined with a thin conformal barrier material. A plurality of metal oxide layers are formed over the conformal barrier material. The plurality of metal oxide layers are reduced by heat treatment to form a multi-metal seed layer. An electrically conductive material is formed over the multi-metal seed layer.
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申请公布号 |
US6943096(B1) |
申请公布日期 |
2005.09.13 |
申请号 |
US20030665938 |
申请日期 |
2003.09.17 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
WANG CONNIE PIN-CHIN;PANGRLE SUZETTE K.;LOPATIN SERGEY |
分类号 |
H01L21/20;H01L21/36;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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