发明名称 Delay circuit, testing apparatus, and capacitor
摘要 A delay circuit having an adjustable delay resolution is provided. The delay circuit has a path through which a signal transmits, a field effect transistor whose source region and drain region are connected to the path, and an impressed voltage control unit which controls a voltage to be impressed to the gate electrode of the field effect transistor. The impressed voltage control unit may be a digital analog converter.
申请公布号 US6944835(B2) 申请公布日期 2005.09.13
申请号 US20030413344 申请日期 2003.04.14
申请人 ADVANTEST CORP. 发明人 OKAYASU TOSHIYUKI
分类号 G01R31/28;G01R31/30;H03K5/00;H03K5/13;(IPC1-7):G06F17/50;H03H11/26 主分类号 G01R31/28
代理机构 代理人
主权项
地址