发明名称 SUBSURFACE SCATTERING APPROXIMATION METHODS AND APPARATUS
摘要 <p>A method for determining illumination of surface points of an object (720) in a scene from lighting sources (700, 710) includes determining a first thickness map (730) for a first lighting source (700) for the scene, wherein the first thickness map includes a first plurality of thickness values (760) of the object with respect to distance from the first lighting source, determining a surface point (790) on the object, determining a first plurality of thickness values associated with the surface point on the object in response to the first thickness map, determining a first filtered thickness value associated with the surface point on the object in response to the first plurality of thickness values, and determining an illumination contribution from (820, 830) the first lighting source at the surface point in response to the first filtered thickness value.</p>
申请公布号 WO2005083639(A1) 申请公布日期 2005.09.09
申请号 WO2004US10046 申请日期 2004.03.31
申请人 PIXAR;WEST, BRADLEY, S.;LOKOVIC, THOMAS;BATTE, DAVID 发明人 WEST, BRADLEY, S.;LOKOVIC, THOMAS;BATTE, DAVID
分类号 G06T15/60;G06T15/70;(IPC1-7):G06T15/60 主分类号 G06T15/60
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