发明名称 Method and apparatus for testing tunnel magnetoresistive effect element
摘要 A method for testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element depending upon a degree of change in resistance of the TMR element. The degree of change in resistance is determined based upon the first resistance value and the second resistance value.
申请公布号 US2005195648(A1) 申请公布日期 2005.09.08
申请号 US20050070237 申请日期 2005.03.03
申请人 TDK CORPORATION 发明人 SARUKI SHUNJI;INAGE KENJI;HACHISUKA NOZOMU;KIYONO HIROSHI
分类号 G01R33/09;G11B5/00;G11B5/39;G11B5/455;G11C11/00;H01L21/8246;H01L27/105;H01L43/08;H01L43/12;(IPC1-7):G11C11/00 主分类号 G01R33/09
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