发明名称 |
Method and apparatus for testing tunnel magnetoresistive effect element |
摘要 |
A method for testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element depending upon a degree of change in resistance of the TMR element. The degree of change in resistance is determined based upon the first resistance value and the second resistance value.
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申请公布号 |
US2005195648(A1) |
申请公布日期 |
2005.09.08 |
申请号 |
US20050070237 |
申请日期 |
2005.03.03 |
申请人 |
TDK CORPORATION |
发明人 |
SARUKI SHUNJI;INAGE KENJI;HACHISUKA NOZOMU;KIYONO HIROSHI |
分类号 |
G01R33/09;G11B5/00;G11B5/39;G11B5/455;G11C11/00;H01L21/8246;H01L27/105;H01L43/08;H01L43/12;(IPC1-7):G11C11/00 |
主分类号 |
G01R33/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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