INSPECTION DEVICE AND METHOD FOR OPTICAL FILM

摘要

PROBLEM TO BE SOLVED: To provide an inspection device and method capable of inspecting an optical film by simple constitution, and capable of detecting easily a defect automatically. SOLUTION: This device is provided with a point light source 1 for projecting a dot pattern onto the optical film 2 to be irradiated, an imaging element 3 capable of picking up reflected light by the optical film 2, and a detecting means for detecting a distortion in the dot pattern of a picked-up image picked up by the imaging element 3. The dot pattern is formed lattice-likely. COPYRIGHT: (C)2005,JPO&NCIPI