发明名称 Method of designing semiconductor integrated circuit, designing apparatus, and inspection apparatus
摘要 A method of designing a semiconductor integrated circuit, comprises: replacing a circuit element disposed in the semiconductor integrated circuit with a transistor having a high threshold value or a circuit element having a small juxtaposition number in order to prevent deviation of a signal voltage flowing through the semiconductor integrated circuit from a power voltage and a ground voltage; replacing a circuit element disposed in a subsequent stage of the replaced circuit element in order to prevent the deviation of the signal voltage from the power voltage and the ground voltage from being propagated to a subsequent stage with a transistor having a high threshold value or a circuit element having a small juxtaposition number; and then arranging circuit elements constituting the semiconductor integrated circuit in such a manner that the semiconductor integrated circuit stably operates.
申请公布号 US2005198594(A1) 申请公布日期 2005.09.08
申请号 US20050057205 申请日期 2005.02.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ITAKA YASUHITO
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
代理机构 代理人
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