发明名称 Process to produce microelectronic components by extreme ultraviolet lithography
摘要 <p>An extreme ultraviolet lithography (EUV) process makes structures (34) in a resist layer (16) by application to the top and bottom (14) faces of a substrate (10) of an electromagnetic absorbent layer (12) operating in the EUV spectrum. The resist layer (16) is then exposed to EUV radiation, followed by development of the resist layer (16) into an appropriate structure.</p>
申请公布号 DE102004007414(A1) 申请公布日期 2005.09.08
申请号 DE20041007414 申请日期 2004.02.16
申请人 INFINEON TECHNOLOGIES AG 发明人 DOMKE, WOLF-DIETER;LOWACK, KLAUS;KRAGLER, KARL;SCHWARZL, SIEGFRIED
分类号 G03F7/09;G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/09
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