发明名称 Error detecting circuit for detecting the location of error
摘要 An error detecting circuit for detecting the location of an error is provided. The error detecting circuit has an error data storing unit and an error data collecting unit. The error data storing unit divides a circuit having areas, and outputs a plurality of error signals in response to a plurality of state error signals, a serial chain signal, a lock-enable signal, and a chip error signal, which are enabled when an error occurs in the corresponding area. The serial chain signal reads the plurality of state error signals if the chip goes out of order when an error occurs in the circuit. The lock-enable signal determines whether or not to preserve the plurality of state error signals. In response to the serial chain signal, the error data storing unit enables a confirmation of at least one state error signals stored in the error data storing unit.
申请公布号 US6941496(B2) 申请公布日期 2005.09.06
申请号 US20010037909 申请日期 2001.11.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM YOUNG-WAN
分类号 G01R31/3183;(IPC1-7):G01R31/28 主分类号 G01R31/3183
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