发明名称 Wavemeter having two interference elements
摘要 A wavemeter for determining a wavelength of an incident optical beam comprises four optical components, each being arranged in the incident optical beam or in a part of it, providing a path with a respective effective optical length, and generating a respective optical beam with a respective optical power depending on the wavelength of the incident optical beam. The optical powers oscillate periodically with increasing wavelength, and a phase shift of approximately pi/2 is provided between two respective pairs of the four optical components. Respective power detectors are provided, each detecting a respective one of the optical powers. A wavelength allocator is provided for allocating a wavelength to the incident optical beam based on the wavelength dependencies of the detected first, second, third, and fourth optical powers.
申请公布号 US6937346(B2) 申请公布日期 2005.08.30
申请号 US20020134578 申请日期 2002.04.29
申请人 AGILENT TECHNOLOGIES, INC. 发明人 NEBENDAHL BERND;SCHMIDT ANDREAS;JAEGER MATTHIAS
分类号 G01J3/26;G01J9/02;H01S5/0687;(IPC1-7):G01B9/02 主分类号 G01J3/26
代理机构 代理人
主权项
地址