Specimen characteristics e.g. roughness, measuring device, has interception unit to intercept X-rays of beam height greater than selected value, in order to limit extension of measuring zone along direction of propagation of incident X-rays

摘要

The device has a source (S) to deliver an X-ray beam along a direction that is approximately parallel to a side (3) of a specimen (E). An interception unit (4) intercepts the X-rays of the beam reaching at the level of a measuring zone (5), with a height greater than a selected value, in order to limit the extension of the zone (5) along a direction of propagation of incident X-rays.