发明名称 STRAINED SILICON-ON-INSULATOR AND METHOD TO FORM THE SAME
摘要 A method for fabricating a strained Si layer on insulator, a structure of the strained Si layer on insulator, and electronic systems comprising such layers are disclosed. The method comprises the steps of forming epitaxially a relaxed SiGe layer on top of a Si layer on insulator; transforming the crystalline Si layer and the lower portion of the crystalline relaxed SiGe layer into an amorphous material state by ion implantation; and re-crystallizing the amorphous material from the crystalline top portion of the SiGe layer. The larger lattice constant of the SiGe seed layer forces a tensile strain in the Si layer.
申请公布号 KR20050083925(A) 申请公布日期 2005.08.26
申请号 KR20057009099 申请日期 2005.05.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COHEN GUY M.;CHRISTIANSEN SILKE H.
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/20;H01L27/12 主分类号 H01L21/20
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