发明名称 Method of fabricating polysilicon thin film and thin film transistor using polysilicon fabricated by the same method
摘要 A method of fabricating a polysilicon thin film produces a polysilicon thin film which is used to make a thin film transistor. The method includes depositing a silicon film containing amorphous silicon on a substrate, and performing thermal treatment on the silicon film at a predetermined temperature in an H<SUB>2</SUB>O atmosphere. Accordingly, the crystallization temperature and thermal treatment time are decreased when the amorphous silicon is crystallized by a solid phase crystallization method, and this prevents the substrate from being bent due to application of a thermal treatment process for a long time and at a high temperature. As a result of the invention, a polysilicon thin film having superior crystallization properties is obtained. Use of the polysilicon thin film in a thin film transistor results in the reduction of defects in the thin film resistor.
申请公布号 US2005186720(A1) 申请公布日期 2005.08.25
申请号 US20050033493 申请日期 2005.01.12
申请人 KAKKAD RAMESH 发明人 KAKKAD RAMESH
分类号 H01L21/205;C30B1/02;C30B29/06;H01L21/20;H01L21/324;H01L21/336;H01L29/786;(IPC1-7):H01L21/00;C30B1/00;H01L21/84;H01L21/36 主分类号 H01L21/205
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