发明名称 Conductive micro-probe and memory device
摘要 <p>A micro-probe that has little deformation and wear while maintaining a desired conductivity is composed of a cylindrical wear resistant material and a conductive material. The wear resistant material provides mechanical contact with a contact target, while the conductive material provides an electrical contact with the contact target. The invention thus provides an ultra-small micro-probe having a long useful life, and that experiences little deformation or wear while maintaining the desired conductivity. <IMAGE></p>
申请公布号 EP0884557(B1) 申请公布日期 2005.08.24
申请号 EP19980110219 申请日期 1998.06.04
申请人 HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATION 发明人 GIBSON, GARY;YAGI, TAKAAKI
分类号 B82B3/00;G01B7/34;G01N37/00;G01Q60/38;G01Q70/14;G01R1/06;G11B5/02;G11B9/00;(IPC1-7):G01B7/34;G01N27/00 主分类号 B82B3/00
代理机构 代理人
主权项
地址