发明名称 Manufacturing system, measurement data collecting system, and measurement terminal apparatus
摘要 A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulated as inspection data and exchanged among the steps.
申请公布号 US6934596(B2) 申请公布日期 2005.08.23
申请号 US20030342130 申请日期 2003.01.14
申请人 SEIKO EPSON CORPORATION 发明人 YOSHIDA YOSHIFUMI;KOJIMA KOICHI;ICHIKAWA YUYA;HIRAI ATSUSHI;TORII HIDEO
分类号 G01D21/00;G06F17/00;G06F19/00;(IPC1-7):G06F19/00 主分类号 G01D21/00
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