发明名称 |
Manufacturing system, measurement data collecting system, and measurement terminal apparatus |
摘要 |
A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulated as inspection data and exchanged among the steps.
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申请公布号 |
US6934596(B2) |
申请公布日期 |
2005.08.23 |
申请号 |
US20030342130 |
申请日期 |
2003.01.14 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
YOSHIDA YOSHIFUMI;KOJIMA KOICHI;ICHIKAWA YUYA;HIRAI ATSUSHI;TORII HIDEO |
分类号 |
G01D21/00;G06F17/00;G06F19/00;(IPC1-7):G06F19/00 |
主分类号 |
G01D21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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