发明名称 CELL CONTINUITY INSPECTION SYSTEM AND CELL CONTINUITY INSPECTION METHOD USED FOR IT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a cell continuity inspection system by which an ATM tester is connected to a plurality of devices to be tested and simultaneously inspected, an inspection time for the ATM cell continuity inspection is shortened, and the inspection of a plurality of the devices to be tested can be executed in real time without enlarging a circuit scale of the device to be tested. <P>SOLUTION: The devices (A-C)2-1 to 2-3 are respectively cascaded to the ATM tester 1 via transmission path cables 100-103, and execute the transmission of an ATM cell for testing. A cell comparator 3 compares a cell transmitted from the ATM tester 1, a cell received by the ATM tester 1, and cells respectively subjected to monitor output toward the cell comparator 3 from respective cell monitors (A-C)21-1 to 21-3 of the devices (A-C)2-1 to 2-3 with a cell comparison inspection part 32 of the cell comparator 3 in real time; and determines the identity of the ATM cell for testing. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005223467(A) 申请公布日期 2005.08.18
申请号 JP20040027432 申请日期 2004.02.04
申请人 NEC SAITAMA LTD 发明人 INADA TAKASHI
分类号 G01R31/02;H04L12/70;H04M3/26;H04Q1/20;(IPC1-7):H04L12/56 主分类号 G01R31/02
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