发明名称 PROCESS FOR PRODUCING p-TYPE ZINC OXIDE THIN FILM AND THIN FILM, AND SEMICONDUCTOR DEVICE
摘要 <p>A process for producing a thin film, in which not only can high crystallinity and surface flatness be realized but also dopant doping can be performed at high concentration. There is provided a process comprising the low temperature highly doped layer growing step of performing dopant doping while growing a thin film at a given first temperature; the annealing step of discontinuing the growth of thin film and annealing the thin film at a given second temperature higher than the first temperature; and the high temperature lowly doped layer growing step of growing a thin film at the second temperature.</p>
申请公布号 WO2005076341(A1) 申请公布日期 2005.08.18
申请号 WO2004JP13246 申请日期 2004.09.10
申请人 TOHOKU UNIVERSITY;KAWASAKI, MASASHI;OHTOMO, AKIRA;FUKUMURA, TOMOAKI;TSUKAZAKI, ATSUSHI;OHTANI, MAKOTO 发明人 KAWASAKI, MASASHI;OHTOMO, AKIRA;FUKUMURA, TOMOAKI;TSUKAZAKI, ATSUSHI;OHTANI, MAKOTO
分类号 C30B29/16;H01L21/205;H01L21/363;H01L33/28;(IPC1-7):H01L21/363 主分类号 C30B29/16
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