发明名称 Self-aligned poly-metal structures
摘要 A semiconductor structure is provided comprising a self-aligned poly-metal stack formed over a semiconductor substrate where the interface between an oxidation barrier placed over the stack and an oxidized portion of the stack lies along the sidewall of the poly-metal stack. A semiconductor structure is also provided where an etch stop layer is present in the poly region of the poly-metal stack. The present invention also relates more broadly to a memory cell array and a computer system including the poly-metal stack of the present invention.
申请公布号 US2005181578(A1) 申请公布日期 2005.08.18
申请号 US20050108436 申请日期 2005.04.18
申请人 AGARWAL KISHNU K. 发明人 AGARWAL KISHNU K.
分类号 H01L21/28;H01L21/336;H01L21/76;H01L21/8242;(IPC1-7):H01L21/76 主分类号 H01L21/28
代理机构 代理人
主权项
地址