发明名称 Substrates having features formed therein and methods of forming
摘要 The described embodiments relate to substrates having features formed therein and methods of forming same. One exemplary method forms a blind feature through a majority of a thickness of a substrate, the blind feature being defined by at least one sidewall surface and a bottom surface. The method also applies an etch resistant material to the blind feature and removes the etch resistant material from at least a portion of the bottom surface. The method further wet etches the substrate at least through the bottom surface sufficient to form a through feature through the thickness of the substrate.
申请公布号 US6930055(B1) 申请公布日期 2005.08.16
申请号 US20040855113 申请日期 2004.05.26
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 BHOWMIK SIDDHARTHA;RIVAS RIO T.;HUTH MARK C.;KNUTH ROCKY H.
分类号 B41J2/16;(IPC1-7):H01L21/302 主分类号 B41J2/16
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