发明名称 |
Substrates having features formed therein and methods of forming |
摘要 |
The described embodiments relate to substrates having features formed therein and methods of forming same. One exemplary method forms a blind feature through a majority of a thickness of a substrate, the blind feature being defined by at least one sidewall surface and a bottom surface. The method also applies an etch resistant material to the blind feature and removes the etch resistant material from at least a portion of the bottom surface. The method further wet etches the substrate at least through the bottom surface sufficient to form a through feature through the thickness of the substrate.
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申请公布号 |
US6930055(B1) |
申请公布日期 |
2005.08.16 |
申请号 |
US20040855113 |
申请日期 |
2004.05.26 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
BHOWMIK SIDDHARTHA;RIVAS RIO T.;HUTH MARK C.;KNUTH ROCKY H. |
分类号 |
B41J2/16;(IPC1-7):H01L21/302 |
主分类号 |
B41J2/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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