TEST DEVICE OF TIMER CIRCUIT,申请号KR20040006871-传众专利搜索

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发明名称	TEST DEVICE OF TIMER CIRCUIT
摘要
申请公布号	KR20050078817(A)	申请公布日期	2005.08.08
申请号	KR20040006871	申请日期	2004.02.03
申请人	LG INNOTEC CO., LTD.	发明人	KIM, KWAN WOO
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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