发明名称 Apparatus for Heat Deviation in Handler for Testing Module IC
摘要 A device for compensating for heat generation in a modular IC test handler is provided which includes at least one supporting member positioned adjacent to a press unit of the handler, and having a cooling fluid flow passage formed therein for flow of cooling fluid, and a plurality of cooling fluid spraying units for spraying the cooling fluid supplied through the cooling fluid flow passage toward faces of modular ICs in an oblique direction from a position between adjacent push bars of the press unit, thereby spraying cooling fluid directly onto ICs attached to a surface of modular ICs during testing and enhancing an efficiency of heat compensation.
申请公布号 KR100505073(B1) 申请公布日期 2005.08.03
申请号 KR20020087797 申请日期 2002.12.31
申请人 发明人
分类号 G01R31/26;H01L21/66;G01R31/28;(IPC1-7):H01L21/66 主分类号 G01R31/26
代理机构 代理人
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