发明名称 Resonant beam scanner with raster pinch compensation
摘要 A MEM s scanning device has a variable resonant frequency. In one embodiment, the MEMs device includes a torsion arm that supports an oscillatory body. In one embodiment, an array of removable masses are placed on an exposed portion of the oscillatory body and selectively removed to establish the resonant frequency. The material can be removed by laser ablation, etching, or other processing approaches. In another approach, a migratory material is placed on the torsion arm and selectively stimulated to migrate into the torsion arm, thereby changing the mechanical properties of the torsion arm. The changed mechanical properties in turn changes the resonant frequency of the torsion arm. In another approach, symmetrically distributed masses are removed or added in response to a measured resonant frequency to tune the resonant frequency to a desired resonant frequency. A display apparatus includes the scanning device and the scanning device scans about two or more axes, typically in a raster pattern. Various approaches to controlling the frequency responses of the scanning device are described, including active control of MEMs scanners and passive frequency tuning.
申请公布号 US6924476(B2) 申请公布日期 2005.08.02
申请号 US20030694286 申请日期 2003.10.27
申请人 MICROVISION, INC. 发明人 WINE DAVID W.;HELSEL MARK P.;BARGER JON D.;TEGREENE CLARENCE T.
分类号 G02B26/08;G02B26/10;G06K7/10;(IPC1-7):H01J5/16 主分类号 G02B26/08
代理机构 代理人
主权项
地址