发明名称 PLASMA ETCHING SYSTEM AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide plasma processing system and method capable of producing a semiconductor integrated circuit at a low cost using a wafer of large diameter. <P>SOLUTION: The plasma processing system comprises a vacuum processing chamber 101, a means for supplying gas to the vacuum processing chamber 101, a plasma generating means 107, and an electrode 103 for mounting a wafer 104 and being applied with a voltage. The electrode 103 mounts a peripheral member 121 being applied with a voltage at the periphery thereof wherein the ratio of the voltage being applied to the peripheral member 121 to the voltage being applied to the electrode 103 is variable. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005203489(A) 申请公布日期 2005.07.28
申请号 JP20040006678 申请日期 2004.01.14
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 OMOTO YUTAKA;SHIRAYONE SHIGERU;SUMIYA MASAHIRO;TAKAHASHI NUSHITO
分类号 H05H1/46;H01L21/3065 主分类号 H05H1/46
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