| 摘要 |
The invention relates to a method for determining a gsm substance and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an X-radiation, scattered from a material sample, a detector signal corresponding to the gsm substance and/or the chemical composition of the material sample is generated and used for determining the gsm substance and/or the chemical composition of the material sample. A device for determining a gsm substance and/or a chemical composition of a material sample has a compact measurement head ( 10 ) arranged unilaterally with respect to the material sample. This measurement head includes an X-radiation source ( 20 ) and a detector arrangement ( 30 ) integrated into the measurement head of at least one X-ray detector connected to a voltage supply and an evaluation unit.
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