发明名称 |
EQUIPMENT AND METHOD FOR PLASMA PROCESSING |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide plasma processing equipment and plasma processing method suitable for a high-speed and very precise etching process. <P>SOLUTION: The plasma processing equipment comprises a processing chamber 1 which is connected to an evacuation apparatus and hence can reduce the pressure, a gas supply apparatus for supplying a gas to the processing chamber 1, a plasma generating means for generating plasmas inside the processing chamber, and a means 12 for applying high-frequency voltage to a workpiece 10. The plasma processing equipment is equipped with a means 11 and 14 for converting voltage having a pulse waveform or rectangular waveform into one having a sinusoidal waveform. The high-frequency voltage application means 12 applies the converted high-frequency voltage having a sinusoidal waveform to the workpiece. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005203491(A) |
申请公布日期 |
2005.07.28 |
申请号 |
JP20040006680 |
申请日期 |
2004.01.14 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YASUI HISATERU;TAMURA HITOSHI |
分类号 |
H05H1/46;C23F4/00;H01L21/3065 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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