发明名称 SAMPLE INSPECTION SYSTEM AND SAMPLE INSPECTION METHOD
摘要 ÄProblemÜ To promptly display the picture data of a plurality of layers of different sample depths on display means. and to display the predeterminedplanar region of a picture having a very large imaging region, easily and promptly at a plurality of spots merely by transmitting the conditions of small data quantities. <??>ÄMeans for ResolutionÜ There are comprised means 653 for generating sample picture data of a plurality of layers of different sample depths from a sample 601 through electronic imaging devices 631 for the respective layers, and for storing the generated sample picture data, means for designating a planar region which is to be extracted from the respective sample picture data, means for extracting extraction picture data corresponding to the planar region, for the respective layers from the respective sample picture data upon receiving the designation of the planar region, and for storing the extraction picture data, and a picture processing apparatus 651 which displays the extracted pictures of the respective layers on display means 652 in an alternative way or simultaneously in a combination of two or more of them, on the basis of the respective extraction picture data of the respective layers. And A method and a system comprising the display layer setting step of setting a first condition which designates a single layer picture 42a to be displayed at a specified terminal 41, on the basis of picture data 42 that have been imaged for a plurality of respective layers of different sample depths from a sample; the display region setting step of setting a second condition which designates a predetermined planar region that is to be extracted from the layer picture 42a designated by the first condition; the first picture display step of displaying the predetermined planar region extracted from the layer picture 42a, at the specified terminal 41 in accordance with the first and second conditions; the condition transmission step of transmitting the first and second conditions to another terminal 52 ; and the second picture display step of displaying a predetermined correspondent planar region corresponding to the predetermined planar region, at the other terminal 51 in accordance with the first and second conditions that have been transmitted to the other terminal 51 and on the basis of correspondent picture data 52 that have been prestored at the other terminal 51 in correspondence with the picture data 42. <IMAGE>
申请公布号 KR20050076839(A) 申请公布日期 2005.07.28
申请号 KR20050062023 申请日期 2005.07.11
申请人 SEIKO PRECISION INC.;NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES 发明人 YASUDA NAKAHIRO;BENTON ERIC;ISHII HITOSHI;TAKAYAMA SUMIKO;INAGAKI SHINSUKE;KOBAYASHI ISAO;HIGASHIMATA ATSUSHI;HONMA YOSHIHIRO;UMESHIMA YOSUKE
分类号 G01B9/04;G01N15/14;G06F19/00 主分类号 G01B9/04
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