发明名称 |
Method of film deposition using single-wafer-processing type CVD |
摘要 |
A method of film deposition using a single-wafer-processing type CVD apparatus includes: (a) sealing a periphery of a susceptor to separate a reaction chamber from a wafer-handling chamber when the susceptor rises; and (b) flowing a gas from the wafer-handling chamber into the reaction chamber through at least one discharge hole formed through the susceptor via a back side and a periphery of a wafer placed on the susceptor during film deposition.
|
申请公布号 |
US6921556(B2) |
申请公布日期 |
2005.07.26 |
申请号 |
US20030403179 |
申请日期 |
2003.03.28 |
申请人 |
ASM JAPAN K.K. |
发明人 |
SHIMIZU AKIRA;FUKUDA HIDEAKI;KAWANO BAIEI;SATO KAZUO |
分类号 |
C23C16/44;C23C16/455;C23C16/458;C23C16/54;H01L21/285;H01L21/3065;(IPC1-7):C23C16/00 |
主分类号 |
C23C16/44 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|