发明名称 INTERFERENCE DEVICE
摘要 PROBLEM TO BE SOLVED: To solve a problem that the interference fringe spacing s and the interference region width W, which are important parameter in the interferometer using an electron beam biprism, could not be controlled mutually independently. SOLUTION: By using two electron beam biprisms in two stages in the optical axis direction, not only the Fresnel diffraction can be avoided, but also the interference fringe spacing s and the interference region width W are independently controlled by controlling the respective electrode voltage of the electron beam biprism. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005197165(A) 申请公布日期 2005.07.21
申请号 JP20040004156 申请日期 2004.01.09
申请人 INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH 发明人 HARADA KEN;AKASHI TETSUYA;TOGAWA YOSHIHIKO;MATSUDA TSUYOSHI;MORIYA NOBORU
分类号 H01J37/295;G01B9/02;G01B15/00;H01J37/305;(IPC1-7):H01J37/295 主分类号 H01J37/295
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